Beamline's Solutions

Move Past Your Challenges, Today

We help semiconductor manufacturers, semiconductor equipment manufacturers, device designers, and researchers in solving research and manufacturing challenges, so they can keep moving forward.

Quality Control
Reduce Cost, Increase Yield

Enhance the effectiveness and efficiency of quality control with superior metrological support—driving positive impacts on your bottom line.

Corner Lot Targeting

Increase yield for high value products.

Recipe Monitoring

Identify equipment issues earlier.

Contamination Monitoring

Ensure the quality of materials and environmental conditions.

Equipment Troubleshooting & Requalification

Resume operations more quickly.

Fab Startup
Startup Fabs, Faster

Accelerate your new fab's launch with expert metrological support for process development and qualification.

Equipment FAT/SAT

Uncover subtle details and confirm performance.
Recipe Development & Verification

Fast-track your path to production.
Technology Transfer

Build confidence for seamless continuity.

Failure Analysis
Resolve Problems, Permanently

Quickly resolve fab issues permanently with root cause analysis support.

Contaminant Analysis

Beamline helps you detect contaminants in your process down to parts-per-trillion (PPT) levels.

Process Troubleshooting

Beamline assists in troubleshooting your manufacturing process by providing precise metrological data to identify the problematic step.

Layer Deconstruction

Beamline enables you to analyze composition, thickness, and layer depth to identify potential issues.

Research & Development
Enable Discovery

Outpace the competition with best-in-industry material innovation support.

Materials Research

Beamline supports next-generation materials from research through to production.

Design of Experiments (DOE)

Beamline assists in generating the data necessary for robust statistical analysis.

Competitive Analysis

Beamline helps deconstruct competitive products to gain insights into the materials and manufacturing processes used.